One-step synthesis of graphene containing topological defects
Publication Date
September 16, 2025
Creators
Description
Raw data repository containing X-ray photoelectron spectroscopy (XPS), X-ray standing waves (XSW), non-contact atomic force microscopy (nc-AFM), scanning tunnelling microscopy (STM), near-edge X-ray absorption fine structure (NEXAFS) spectroscopy, Raman spectroscopy, tunnelling electron microscopy (TEM) and density functional theory (DFT) data for the work "One-step synthesis of graphene containing topological defects" published in Chemical Science
Collection dates:
01/03/2020-03/03/2025
Associate publ. DOI
Subjects (LCSH)
Subjects
Subjects (JACS)
Subjects (LC)
Divisions
University of Nottingham, UK Campus
Data type
Raw experimental data
Funders
Diamond Light Source
MAX IV
Spectroscopy Research Technology Platform, University of Warwick
Deutsche Forschungsgemeinschaft
UKRI
Royal Soceity
Grant Number
SI25379-4
SI30875-1
SI31695-3
NT31165-2
NT33709-1
NT39165
20200269
KL 3430/1-1
EP/S022848/1
MR/S016023/1
MR/X023109/1
EP/X014088/1
EP/X012883/1
EP/V053884/1
EP/R029431/1
EP/X035859/1
EP/X035514/1
Data collection method
nc-AFM, DFT, NEXAFS, Raman, STM, TEM, XPS and XSW
Resource languages
English
Publisher
The University of Nottingham
Date Issued
September 19, 2025
Except where otherwise noted, this item's license is described as
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Name
DFT.zip
Size
40.26 MB
Format
Unknown
Checksum (MD5)
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Name
XPS_temperature_calibration.zip
Size
50.05 KB
Format
Unknown
Checksum (MD5)
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