Data are stored in the following directories:

AFM  AFM images of In2Se3 on mica, SiO2, graphite which can be viewed using freeware WSxM or Gwyddion.

Devices  measured electrical characteristics which can be analysed using Origin.

Optical images  showing devices and grown material  standard viewing packages available on Windows, Apple and other standard operating systems.

PL  photoluminescence data which can be analysed using Origin

Raman  Raman spectra which can be analysed using Origin

XPS  X-ray photoelectron spectroscopy data

X-ray Diffraction  XRD data which can be read using Excel

Directory Structure:

--DATA
  +---AFM
     +---Exfoliated alpha-In2Se3
     +---Films grown on Mica
     +---Films grown on SiO2
  +---Devices
  +---Optical Images
     +---Device
     +---Growth on Graphite
     +---Growth on mica
     +---Growth on SiO2 substrate
  +---PL
  +---Raman
  +---XPS
  +---XRD